An interventional study of Implantation of the VADLINK Percutaneous Left Ventricular Assist Device and VA-ECMO in High-Risk Percutaneous Coronary Intervention (High-risk PCI) and Left Ventricular Assist Devices, sponsored by Suzhou Hengruihongyuan Medical Technology Co. LTD. Recruiting at 15 sites in China. Open to participants aged 18 Years to 90 Years. Per ClinicalTrials.gov, last updated 2025-08-26.
Sponsored by Suzhou Hengruihongyuan Medical Technology Co. LTD · Not applicable, Interventional, and Treatment
Mechanical circulatory support (MCS) is a life-sustaining therapy first introduced in the 1950s. After six decades of development, it now serves as a critical bridge therapy for patients with acute cardiac events and end-stage heart failure. Percutaneous mechanical circulatory support (pMCS), a key MCS modality, has advanced rapidly in recent years.
In China, pMCS adoption has accelerated significantly, evidenced by year-over-year growth in both specialized centers and clinical cases, alongside continuous technological refinement.
Common pMCS devices include: Intra-Aortic Balloon Pump (IABP), Axial flow pump systems (e.g., Impella®), Extracorporeal Membrane Oxygenation (ECMO). However, no randomized study has compared Impella with VA-ECMO in CHIP patients.
The aim of the study is to evaluate the effectiveness and safety of interventional left ventricular assist system (VADLINK) compared to the VA-ECMO in providing circulatory support for complicated and high-risk patient with indications for PCI.
Suzhou Hengruihongyuan Medical Technology Co. LTD is the lead sponsor of 8 studies on the registry; 3 are open to participants now.
Counted across the registry records on this site, refreshed daily.
1. Aged 18-90 2. The investigator assesses that the subject requires coronary revascularization, but CABG (Coronary Artery Bypass Grafting) is considered high-risk or the subject refuses CABG. The investigator believes the subject may benefit from PCI (Percutaneous Coronary Intervention).
3. Left ventricular ejection fraction (LVEF) ≤ 35%. 4. Coronary angiography (CAG) or coronary computed tomography angiography (CTA) shows any of the following conditions:
5. Patients who are able to give informed consent and complete the follow-up.
Exclusion Criteria:
Other conditions deemed by the investigator as unsuitable for participation in this trial.
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The VADLINK percutaneous left ventricular assist system will offer intraoperative hemodynamic support during high-risk PCI procedures.
Device: Implantation of the VADLINK Percutaneous Left Ventricular Assist Device
The VA-ECMO offers intraoperative hemodynamic support during high-risk PCI procedures.
Device: VA-ECMO
To implant VADLINK percutaneous left ventricular assist device during percutaneous coronary intervention (PCI).
Received venous arterial extracorporeal membrane oxygenation (VA-ECMO) during PCI.
30-day Major Adverse Events (MAE) rate
Occurrence of a major adverse event (MAE) up to 30 days post-implantation. Major adverse event is a composite endpoint, defined as all-cause death, stroke, myocardial infarction, Unplanned percutaneous coronary intervention (PCI) or coronary artery bypass grafting (CABG), cardiovascular hospitalization, MCS-ARC defined bleeding types 3, 4, or 5, acute kidney injury, serious device-related adverse events, cardiopulmonary resuscitation or ventricular arrhythmias after electrical cardioversion.
Time frame: From enrollment to 30 ±7 days after PCI surgery
The MACCE rate
Incidence of Major Adverse Cardiovascular and Cerebrovascular Events (MACCE) within 30 or 90 days after surgery.
Time frame: 30, 90 days
Transfusion rate
Transfusion rate within 30 days after surgery.
Time frame: 30 days
Mean units transfused
Mean Number of Blood Units Transfused within 30 Days Postoperatively.
Time frame: 30 days
Incidence of hemodynamic instability
Incidence of hemodynamic instability within 30 days device implantation.
Time frame: 30 days
90-day Major Adverse Events (MAE) rate
Time frame: 90 days
Incidence of device-related adverse events
Time frame: Implant up through 90 days
Incidence of device-related serious adverse events
Time frame: Implant up through 90 days
Incidence of adverse events
Time frame: Implant up through 90 days
Serious adverse event incidence rate
Time frame: Implant up through 90 days
Incidence of device defects
Time frame: Periprocedural
Plan to share: No
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Suzhou Hengruihongyuan Medical Technology Co. LTD